Sneek, Netherlands

Jelmer Van Der Meij

This inventor holds 2 USPTO granted patents. Top assignee: Huhtamaki Nederland Bv. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jelmer Van Der Meij. Retrieved from https://idiyas.com/inventor/jelmer-van-der-meij

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2025

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2 patents (USPTO):Explore Patents

Title: The Innovations of Jelmer Van Der Meij

Introduction

Jelmer Van Der Meij is a notable inventor based in Sneek, Netherlands. He has made significant contributions to the field of packaging, particularly with his innovative designs. With a total of 2 patents to his name, he continues to push the boundaries of what is possible in his industry.

Latest Patents

One of his latest patents is an innovative egg carton design. This invention showcases his commitment to improving packaging solutions and enhancing product safety. His work at Huhtamaki Nederland Bv has allowed him to develop practical applications for his ideas.

Career Highlights

Throughout his career, Jelmer has focused on creating efficient and sustainable packaging solutions. His experience at Huhtamaki Nederland Bv has provided him with the platform to implement his inventive ideas. His contributions have not only benefited his company but also the broader packaging industry.

Collaborations

Jelmer has collaborated with talented individuals such as Hendrik Freerk Kloosterman and Roelof De Haan. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Jelmer Van Der Meij is a dedicated inventor whose work in packaging continues to make a significant impact. His innovative spirit and collaborative efforts are paving the way for future advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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