Long Beach, CA, United States of America

Jeffrey Rossin

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Relativity Space, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey Rossin. Retrieved from https://idiyas.com/inventor/jeffrey-rossin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jeffrey Rossin and Automated Defect Recognition

Introduction

Jeffrey Rossin is an inventor associated with Relativity Space, Inc., in Long Beach, California. His patent work addresses automated inspection of articles using radiographic imaging and pore classification.

Latest Patents

Rossin is credited with 1 patent: “Automated Defect Recognition and Determinations of Pore Cluster Compliance.” The disclosed process obtains a radiographic (RT) image of an article, identifies overlapping image portions, and classifies their pixels with a pore classification model. It then generates a pore map, maps that information onto the article using sensor data, and identifies and displays regions that exceed rejection thresholds established by predefined rules.

Career Highlights

Rossin’s listed patent reflects work on automating defect recognition and evaluating pore clusters. The approach combines image analysis, sensor data, and predefined acceptance rules to help identify regions that may not meet specified requirements.

Collaborations

Rossin’s listed coworkers include Christopher Sacco and Viraj Sinha. His company affiliation is Relativity Space, Inc.

Conclusion

Jeffrey Rossin’s patent describes an automated radiographic inspection process that maps pores and flags regions exceeding defined rejection thresholds.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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