Wrentham, MA, United States of America

Jeffrey R Vahue

This inventor holds 1 USPTO granted patent. Top assignee: Pratt-Whitney Canada Corp. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey R Vahue. Retrieved from https://idiyas.com/inventor/jeffrey-r-vahue

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Jeffrey R. Vahue: Innovator in Aircraft Data Systems

Introduction

Jeffrey R. Vahue is a notable inventor based in Wrentham, MA (US). He has made significant contributions to the field of aircraft data systems, showcasing his innovative spirit through his patented inventions.

Latest Patents

One of his key patents is titled "Configurable Aircraft Data Acquisition and/or Transmission System." This invention involves a sophisticated aircraft data acquisition and transmission system that utilizes a memory to store various configurations. The system includes a processor that executes applications to manage data acquisition behaviors in aircraft, enhancing their operational efficiency.

Career Highlights

Jeffrey R. Vahue is associated with Pratt & Whitney Canada Corp, where he applies his expertise in developing advanced aerospace technologies. His work has been instrumental in improving data management systems within aircraft, contributing to the overall safety and performance of aviation technology.

Collaborations

He collaborates with talented professionals in the industry, including his coworker James Mood, to drive innovation and enhance the capabilities of aircraft systems.

Conclusion

Jeffrey R. Vahue's contributions to aircraft data systems exemplify his commitment to innovation in aerospace technology. His patented work continues to influence the industry, paving the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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