Company Filing History:
Years Active: 1999-2002
Title: The Innovative Contributions of Jeffrey R Elings
Introduction
Jeffrey R Elings is a notable inventor based in Santa Barbara, California. He has made significant contributions to the field of probe-based measuring instruments, holding a total of 2 patents. His work focuses on enhancing measurement reproducibility and understanding mechanical properties on a small scale.
Latest Patents
One of his latest patents is titled "Method and apparatus for cleaning a tip of a probe of a probe-based measuring instrument." This invention ensures a high degree of measurement reproducibility for instruments like atomic force microscopes (AFM) by periodically operating in a tip cleaning mode. This mode removes contaminants from the tip, which is crucial for maintaining accuracy over time. The cleaning process can involve ramming the tip into the sample or using various materials to interact with the tip to remove contaminants.
Another significant patent is "Method and apparatus for measuring mechanical properties on a small scale." This invention allows for the measurement of a surface's mechanical properties using a pointed tip on a bendable cantilever. By applying force to the cantilever, the tip can indent the surface, and the resulting indentation can be measured by oscillating the cantilever. This innovative approach provides valuable insights into the mechanical characteristics of materials.
Career Highlights
Throughout his career, Jeffrey R Elings has worked with prominent companies in the field, including Digital Instruments and Veeco Instruments Inc. His experience in these organizations has contributed to his expertise and the development of his patented technologies.
Collaborations
Jeffrey has collaborated with notable individuals such as Virgil B Elings and Christopher C Schmitt. These collaborations have likely enriched his work and led to further advancements in his field.
Conclusion
Jeffrey R Elings is a distinguished inventor whose work has significantly impacted the field of probe-based measurement technologies. His innovative patents demonstrate his commitment to enhancing measurement accuracy and understanding material properties. His contributions continue to influence the industry and inspire future innovations.