Cedar Park, TX, United States of America

Jeffrey R Blank

This inventor holds 1 USPTO granted patent. Top assignee: Riverbed Technology, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey R Blank. Retrieved from https://idiyas.com/inventor/jeffrey-r-blank

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jeffrey R. Blank and Patent Innovation at Riverbed Technology

Introduction

Jeffrey R. Blank is an inventor based in Cedar Park, Texas, United States. His patent work includes a system for turning infrastructure measurements into actionable operational insights.

Latest Patents

Blank is associated with 1 patent, titled “Analytics-correlation-runbooks pipeline for surfacing actionable insights.” The invention receives measurement data from sensors in a computing infrastructure and stores it in a monitoring database. When a measurement falls outside its expected range and matches a detection pattern, the system issues a notification and runs a corresponding runbook. A command in the runbook can query the database for a different measurement, and the system uses the runbook’s results to generate an actionable insight.

Career Highlights

Blank is associated with Riverbed Technology, Inc. His patent describes an approach to correlating infrastructure measurements with automated diagnostic procedures, helping surface insights that can guide operational responses.

Collaborations

The provided information identifies Bryan Thomas Elverson and Jason D. Garrabrant as Blank’s coworkers. It does not specify whether they collaborated with him on this patent.

Conclusion

Jeffrey R. Blank’s patent focuses on connecting sensor data, detection patterns, and automated runbooks to produce actionable insights for computing infrastructure.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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