Company Filing History:
Years Active: 2004
Title: The Innovative Contributions of Jeffrey P Nicolich
Introduction
Jeffrey P Nicolich is a notable inventor based in Albany, NY (US). He has made significant contributions to the field of analytical techniques, particularly in the realm of x-ray technology. His work focuses on enhancing the efficiency of material screening processes through innovative methods.
Latest Patents
Nicolich holds a patent for "X-ray analytical techniques applied to combinatorial library screening." This invention presents an x-ray apparatus and method designed to control x-rays for analyzing combinatorial libraries. The goal is to facilitate the rapid screening of various materials and conditions. The apparatus comprises a laboratory x-ray source, one or more x-ray optics, a combinatorial library, and a detector, such as an x-ray detector or an electron energy detector. This technology allows for analytical measurements on individual members of the library, including x-ray fluorescence, x-ray diffraction, total reflection x-ray fluorescent spectrometry, and extended x-ray absorption fine structure.
Career Highlights
Nicolich is associated with X-ray Optical Systems Incorporated, where he applies his expertise in x-ray technology. His work has contributed to advancements in analytical techniques, making significant impacts in research and development.
Collaborations
One of Nicolich's notable collaborators is David M Gibson. Their partnership has likely fostered innovative ideas and advancements in their field.
Conclusion
Jeffrey P Nicolich's contributions to x-ray analytical techniques exemplify the importance of innovation in scientific research. His patent and work at X-ray Optical Systems Incorporated highlight his role as a key figure in advancing material screening technologies.