Gurnee, IL, United States of America

Jeffrey M Kresch


Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 1992

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2 patents (USPTO):Explore Patents

Title: Innovations by Jeffrey M Kresch

Introduction

Jeffrey M Kresch is an accomplished inventor based in Gurnee, IL (US). He has made significant contributions to the field of sensor technology, holding a total of 2 patents. His work focuses on enhancing the functionality and precision of scanning radiation sensors.

Latest Patents

One of his latest patents is a "Scanning Radiation Sensor with Automatic Focus Control for Optimal Focus." This invention features a scanning radiation sensor that automatically adjusts the focus of an optical system based on the distance to the target. The system utilizes a focusing controller, motor driver, and focus motor to ensure optimal focus across various points along a line.

Another notable patent is the "Scanning Infrared Temperature Sensor with Sighting Apparatus." This invention incorporates a solid-state laser visible light source that marks a continuous line when the sensor operates in continuous mode. In spot mode, the light source turns on and off at precise intervals to mark multiple spots along the scan line. A CCD camera with an automatic gain control circuit enhances the visibility of the light markings on the target.

Career Highlights

Jeffrey M Kresch is currently employed at Square D Company, where he continues to innovate in the field of sensor technology. His work has contributed to advancements in how sensors operate and interact with their environments.

Collaborations

Throughout his career, Kresch has collaborated with notable colleagues, including William J Danley and Eugene F Kalley. These partnerships have fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

Jeffrey M Kresch's contributions to sensor technology through his patents demonstrate his commitment to innovation. His work continues to influence the field, showcasing the importance of advancements in sensor capabilities.

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