Endicott, NY, United States of America

Jeffrey M Gertner

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: International Business Machines Corporation. Active years: 2019-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey M Gertner. Retrieved from https://idiyas.com/inventor/jeffrey-m-gertner

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019-2021

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2 patents (USPTO):Explore Patents

Title: Jeffrey M. Gertner and Software Testing Innovation.

Introduction

Jeffrey M. Gertner is an inventor based in Endicott, New York, whose patent work addresses software testing systems. His listed portfolio includes 2 patents.

Latest Patents

Gertner’s listed patent, “Ideal Age Vector Based File Retention in a Software Testing System,” describes a method for managing stored software version files. The system determines an ideal age vector from historical bug-age data associated with a software product. When a new version file arrives, it uses that vector to select a file for deletion, keeping the number of stored files at the existing limit.

Career Highlights

Gertner is associated with International Business Machines Corporation (IBM). His patent work reflects an approach to software testing that uses historical defect data to guide version-file retention.

Collaborations

Timothy D. Greer is listed as Gertner’s coworker. The provided information does not specify whether Greer collaborated on the patent.

Conclusion

Jeffrey M. Gertner’s listed invention applies historical bug-age data to file-retention decisions, helping software testing systems manage version files within a defined storage limit.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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