Akron, OH, United States of America

Jeffrey Leon Sevart

This inventor holds 24 USPTO granted patents, primarily in Tire Technology. Top assignee: The Goodyear & Tire Rubber Company. Active years: 1997-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey Leon Sevart. Retrieved from https://idiyas.com/inventor/jeffrey-leon-sevart

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 91.7

Average Co-Inventor Count = 4.1

ph-index = 18

Forward Citations = 766(Granted Patents)


Location History:

  • Broadview Heights, OH (US) (1997 - 1998)
  • Akron, OH (US) (2000 - 2017)
  • Cuyahoga Falls, OH (US) (2017 - 2023)

Company Filing History:


Years Active: 1997-2023

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Areas of Expertise:
Tire
Tread Design
Pneumatic Tire
Rib Irregular Wear
Decoupling Groove
Wear Prediction
Diverse Properties
Internal Rib
Lateral Slip
Tire Performance
Tire Materials
Tire Engineering
24 patents (USPTO):Explore Patents

Title: Jeffrey Leon Sevart - Pioneering Inventor from Akron, OH

Introduction: Jeffrey Leon Sevart is a distinguished inventor hailing from Akron, Ohio, known for his groundbreaking contributions to various industries.

Latest Patents: Jeffrey Leon Sevart holds several patents in the fields of automotive engineering, renewable energy, and consumer electronics, showcasing his versatility and innovative spirit.

Career Highlights: With a career spanning over two decades, Sevart has worked with leading companies to develop cutting-edge technologies that have revolutionized the way we live and work.

Collaborations: Throughout his career, Jeffrey Leon Sevart has collaborated with top researchers, engineers, and designers to bring his ideas to life, resulting in successful products that have had a significant impact on society.

Conclusion: Jeffrey Leon Sevart's passion for innovation and his relentless drive to push the boundaries of what is possible make him a true visionary in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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