Title: Jeffrey J Bishop - Innovator in Analyzing Technologies
Introduction: Jeffrey J Bishop is an accomplished inventor based in Dublin, CA (US). He is currently associated with Novilux, LLC, where he focuses on developing advanced analytical systems. Although he has not yet been granted any patents, his work is significant in the field of diagnostics and sample analysis.
Latest Patent Applications: Jeffrey J Bishop has been involved in several innovative projects, including the following patent applications:
1. **Point of Care Concentration Analyzer**: This analyzer system includes a cartridge designed to receive a sample. The cartridge features multiple chambers for isolating a target analyte and collecting a quantity of a first label proportional to the target analyte in the sample. The system comprises an analyzer with a first electromagnetic radiation source, a first detector, and a controller. The first electromagnetic radiation source provides electromagnetic radiation to form an interrogation space within a detection chamber of the cartridge. The first detector detects electromagnetic radiation emitted in the interrogation space by the first label if present. The controller identifies the presence of the target analyte based on the detected electromagnetic radiation.
2. **Multiplexed Single Molecule Analyzer**: This application discloses analyzers and systems for determining multiple label species. The analyzer includes one or more sources of electromagnetic radiation to provide radiation at wavelengths within the excitation bands of various fluorophore species. This system is capable of detecting the presence or absence of different target analytes in a single sample, making it particularly useful for diagnostics.
Conclusion: Jeffrey J Bishop is a notable inventor whose work in analytical technologies holds promise for advancements in diagnostics. His innovative patent applications reflect his commitment to improving sample analysis methods.