Scottsville, NY, United States of America

Jeffrey Heintz

This inventor holds 1 USPTO granted patent. Top assignee: Rochester Institute of Technology. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey Heintz. Retrieved from https://idiyas.com/inventor/jeffrey-heintz-2reue6c5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Jeffrey Heintz: Inventor in Remanufacturability Assessment

Introduction

Jeffrey Heintz is an inventor associated with Rochester Institute of Technology in Scottsville, New York. His work includes a patented method and system for assessing whether items in an apparatus can be remanufactured.

Latest Patents

Heintz is credited with 1 patent: “Method and System for Assessing Remanufacturability of an Apparatus.” The invention evaluates remanufacturing options for items by considering each item’s overall condition, whether it meets operational specifications, and its risk priority. These assessments help identify which remanufacturing options are viable.

Career Highlights

Heintz’s patent addresses the evaluation of remanufacturing opportunities within an apparatus. By combining condition, specification, and risk assessments, the method provides a structured way to determine suitable options for individual items.

Collaborations

Heintz’s listed coworkers include Nabil Nasr and Timothy Bold. His association with Rochester Institute of Technology places his work within an institutional setting connected to research and innovation.

Conclusion

Jeffrey Heintz’s patented system offers a methodical approach to assessing remanufacturability, using item condition, operational requirements, and risk to identify viable options.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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