Randallstown, MD, United States of America

Jeffrey H Bruton

This inventor holds 1 USPTO granted patent. Top assignee: Becton Dickinson and Company Limited. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey H Bruton. Retrieved from https://idiyas.com/inventor/jeffrey-h-bruton

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Jeffrey H. Bruton and His Patent for an Amplified Analyte Assay.

Introduction

Jeffrey H. Bruton is an inventor associated with Randallstown, Maryland, and Becton Dickinson and Company Limited. His patent work includes an assay method designed to increase sensitivity when detecting an analyte.

Latest Patents

Bruton is credited with 1 patent: “Amplified Assay for Analyte.” The invention describes an indirect assay that uses a particle carrying multiple molecules of one or more compounds to amplify the assay signal. In a sandwich-assay format, at least one compound binds to the analyte, while a tracer binds to compounds on the particle. This arrangement can allow multiple tracer molecules to be indirectly associated with a single analyte molecule in the assay complex.

Career Highlights

The available information connects Bruton’s patent activity with Becton Dickinson and Company Limited. His patented assay approach focuses on improving sensitivity through the use of particles bearing multiple binding compounds.

Collaborations

Stephen J. Lovell is identified as Bruton’s coworker. The available details do not specify whether Lovell collaborated on the patent.

Conclusion

Jeffrey H. Bruton’s recorded invention applies particle-based signal amplification to analyte testing, reflecting a practical innovation in assay sensitivity.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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