Jeffrey D West

Title: The Innovations of Jeffrey D. West

Introduction

Jeffrey D. West is an accomplished inventor based in Eau Claire, Wisconsin. He has made significant contributions to the field of technology, particularly in the area of testing methodologies for electronic designs. His innovative work has led to the development of a patent that enhances the efficiency and effectiveness of testing processes.

Latest Patents

Jeffrey D. West holds a patent titled "Apparatus and method for testing using clocked test access port controller for level sensitive scan designs." This patent describes a test access port controller designed for use in level sensitive scan designs. The controller includes test design logic with at least one serial scan test path. It operates in a system test mode, controlling the serial shifting of input test data into the test path and managing the output test data after system mode tests. The patent also details the clock logic that provides both test and system clocks to facilitate the testing process.

Career Highlights

Jeffrey D. West is currently employed at Cray Research, Inc., where he applies his expertise in electronic design and testing. His work at Cray Research has allowed him to contribute to advancements in high-performance computing and technology solutions. His innovative approach to testing methodologies has positioned him as a valuable asset in the field.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Jeffrey D. West's contributions to the field of technology through his patent and work at Cray Research, Inc. highlight his role as an influential inventor. His innovative testing methodologies continue to impact the industry positively.