San Jose, CA, United States of America

Jeffrey D Bonde

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Lam Research Corporation. Active years: 2023.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Jeffrey D Bonde

Introduction

Jeffrey D Bonde is a notable inventor based in San Jose, California. He has made significant contributions to the field of reflectometry, particularly in monitoring substrate movement. His work is essential in various applications, especially in semiconductor manufacturing.

Latest Patents

Jeffrey D Bonde holds a patent for a reflectometer designed to monitor substrate movement. This invention includes various embodiments that feature a reflectometry system capable of monitoring and controlling conditions associated with a substrate, such as a silicon wafer. The system comprises a light source that emits a beam of light directed at the substrate, collection optics that receive the reflected light, and a processor that processes the signal to control the substrate's movement.

Career Highlights

Bonde's career is marked by his role at Lam Research Corporation, where he has been instrumental in developing advanced technologies for the semiconductor industry. His innovative approach has led to the creation of systems that enhance the efficiency and accuracy of substrate handling.

Collaborations

Throughout his career, Jeffrey has collaborated with talented individuals such as Eric A Pape and Dmitry Opaits. These collaborations have fostered an environment of innovation and have contributed to the success of their projects.

Conclusion

Jeffrey D Bonde's contributions to reflectometry and substrate monitoring are invaluable to the semiconductor industry. His innovative spirit and collaborative efforts continue to drive advancements in technology.

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