Jeffery C Gannon

Title: **Jeffery C. Gannon: Innovating Testing Methodologies in Austin, TX**

Introduction

Jeffery C. Gannon is a distinguished inventor based in Austin, Texas, known for his significant contributions to the field of sensor technology. With two patents to his name, he plays a vital role in advancing high-performance testing methodologies for transducers, showcasing his innovative spirit and technical expertise.

Latest Patents

Among Gannon's latest innovations is a patented method and apparatus for the generation of test bitstreams, aimed at testing closed-loop transducers. This innovative approach integrates a test bitstream signal with a Sigma-Delta feedback bitstream from the transducer, producing a combined bitstream that is converted into a physical feedback for the sensor. The output of the transducer is recorded, enabling comprehensive analysis of its characteristics. Notably, the test bitstream signal is a pulse density modulated signal that is oversampled, leading to low noise and distortion in test signals. This advancement allows for the creation of continuous test patterns through the repetitive access of short-length test patterns, enhancing the precision and efficiency of testing procedures.

Career Highlights

Gannon is currently associated with I/O Sensors, Inc., where he applies his innovative insights to develop cutting-edge testing solutions. His work is pivotal in improving the functionalities of various sensor technologies, making a substantial impact in the industry.

Collaborations

Throughout his career, Gannon has collaborated with notable colleagues, including Michael L. Abrams and Ben William Jones. These collaborations have fostered a creative environment that sparks innovation and furthers the development of their shared projects.

Conclusion

Jeffery C. Gannon's contributions to the field of sensor technology exemplify the impact of innovative thinking in advancing industry practices. His patents reflect a commitment to excellence and the continuous pursuit of enhancing testing methodologies for high-performance transducers. As he continues his work at I/O Sensors, Inc., Gannon is poised to influence the future of sensor technology and testing solutions significantly.