This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Fluke Corporation. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: Jeff Gust: Innovator in Impedance Measurement Technology
Introduction
Jeff Gust is a notable inventor based in Everett, WA (US). He has made significant contributions to the field of impedance measurement technology. With a focus on enhancing the accuracy and efficiency of measurement devices, his work has implications across various industries.
Latest Patents
Jeff Gust holds a patent for "Systems and methods for calibration using impedance simulation." This innovative method and apparatus are designed for calibrating an impedance measurement device. The device outputs a first AC signal to a phase-locked current generator, which then generates a second AC signal. This second signal is phase-locked to the first and has an amplitude that represents a known impedance value. The impedance measurement device uses this second AC signal to perform measurements, ensuring accurate calibration based on the known impedance value.
Career Highlights
Jeff Gust is currently employed at Fluke Corporation, a leader in electronic test tools and software. His work at Fluke has allowed him to apply his expertise in impedance measurement, contributing to the development of advanced calibration techniques. His innovative approach has positioned him as a key figure in the field.
Collaborations
Throughout his career, Jeff has collaborated with talented individuals such as Liangzhu Chen and Songnan Fan. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.
Conclusion
Jeff Gust's contributions to impedance measurement technology exemplify the impact of innovative thinking in engineering. His patent and work at Fluke Corporation highlight his commitment to advancing measurement accuracy. His efforts continue to influence the industry and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
