Mountain View, CA, United States of America

Jeff Chung

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Virtual Instruments Corporation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeff Chung. Retrieved from https://idiyas.com/inventor/jeff-chung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Jeff Chung: Inventor in Network Monitoring

Introduction

Jeff Chung is an inventor based in Mountain View, California. His patent work addresses monitoring multimode optical data networks while minimizing interference with the primary data stream.

Latest Patents

The provided information lists one patent associated with Chung: “Network Monitoring Using Thin Film Splitters and Avalanche Photodiode Detectors in Multimode Application.” The invention describes a monitoring system that uses a filter-based splitter and an avalanche photodiode detector subsystem. It diverts a very small portion of the main optical signal for monitoring, with the splitter designed to operate fairly uniformly across modes and avoid disrupting either the main or monitoring data streams.

Career Highlights

Chung is associated with Virtual Instruments Corporation. His listed patent reflects work on optical network monitoring and signal detection.

Collaborations

The provided information names Rama Vuppuladhadium and John Marcolina as Chung’s coworkers.

Conclusion

Jeff Chung’s listed invention focuses on monitoring multimode optical networks by extracting a small signal for analysis while preserving the main data stream. His patent work is associated with Virtual Instruments Corporation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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