Company Filing History:
Years Active: 1995
Title: Jeff A Engel: Innovator in Memory Testing Technologies
Introduction
Jeff A Engel is a notable inventor based in Chisago City, MN (US). He has made significant contributions to the field of memory testing technologies, holding a total of 2 patents. His work focuses on improving the efficiency and effectiveness of testing memory devices, which is crucial in the ever-evolving landscape of technology.
Latest Patents
Engel's latest patents include a "Built-in-self-test scheme for testing multiple memory elements" and "VLSI embedded RAM test." The first patent describes an apparatus designed to efficiently test a plurality of memory devices at the board level. This invention minimizes the logic required and can be integrated into a controller chip within the board design. It also allows for testing the interconnect lines between the controller chip and the memory devices, requiring minimal setup time while performing functional tests quickly.
The second patent, "VLSI embedded RAM test," outlines a method for comprehensively testing embedded RAM devices. This invention detects any cells within the embedded RAM that may have a slow write recovery time. Engel's preferred mode utilizes built-in self-test (BIST) techniques, employing a modified 5N march test sequence to ensure the functionality and recovery time requirements of the embedded RAM devices.
Career Highlights
Jeff A Engel is currently associated with Unisys Corporation, where he continues to innovate in the field of memory testing. His work has had a significant impact on the efficiency of memory device testing, contributing to advancements in technology.
Collaborations
Engel has collaborated with notable coworkers, including Larry L Byers and Gerald J Maciona. Their combined expertise has furthered the development of innovative solutions in memory testing.
Conclusion
Jeff A Engel's contributions to memory testing technologies through his patents and work at Unisys Corporation highlight his role as a key innovator in the field. His inventions not only enhance testing efficiency but also ensure the reliability of memory devices in various applications.