Springboro, OH, United States of America

Jeem Newland, Iii

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Illinois Tool Works Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeem Newland, Iii. Retrieved from https://idiyas.com/inventor/jeem-newland-iii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Jeem Newland, III: Inventor of Surface Disinfection Systems

Introduction

Jeem Newland, III, is an inventor based in Springboro, Ohio, whose patent work concerns systems for disinfecting and drying objects and surfaces. He is associated with Illinois Tool Works Inc.

Latest Patents

Newland is named on one patent: “Systems and Methods to Disinfect an Object or Surface.” The invention describes ways to treat objects, containers, and surfaces using technologies such as air delivery systems, far-ultraviolet light emitters, and air-treatment devices, including gaseous hydrogen-peroxide generators. An ionizer may also be used to reduce static in the air within or supplied to the treatment area. These approaches can condition ambient air to prepare surfaces or containers for subsequent use.

Career Highlights

Newland’s listed patent activity focuses on disinfection and drying technologies. His work addresses methods for treating objects and surfaces before use, including applications such as preparing containers before filling.

Collaborations

Newland’s listed coworkers include Barbara Stefl and William Richard Immell. The patent is associated with Illinois Tool Works Inc.

Conclusion

Jeem Newland, III’s patent work at Illinois Tool Works Inc. centers on practical systems for disinfecting and drying objects, containers, and surfaces.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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