Goyang, South Korea

Jee Hang Lee

This inventor holds 1 USPTO granted patent. Top assignee: Haii Corp.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jee Hang Lee. Retrieved from https://idiyas.com/inventor/jee-hang-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Jee Hang Lee

Introduction

Jee Hang Lee is a notable inventor based in Goyang-si, South Korea. He has made significant contributions to the field of cognitive function identification through his innovative patent. His work reflects a deep understanding of technology and its application in enhancing user experience.

Latest Patents

Jee Hang Lee holds a patent for a technique that identifies the cognitive function state of a user. The patent describes a method that utilizes at least one processor of a device to assess a user's cognitive state. This method involves inputting user information, voice data, and speech time information into a cognitive function state identification model. The model then outputs data that helps in identifying the cognitive function state of the user.

Career Highlights

Jee Hang Lee is associated with Haii Corp., where he applies his expertise in cognitive technology. His work at the company showcases his commitment to advancing the understanding of cognitive functions and their implications in technology.

Collaborations

Some of his coworkers include Ho Yung Kim and Dong Han Kim, who contribute to the innovative environment at Haii Corp. Their collaboration fosters a culture of creativity and technological advancement.

Conclusion

Jee Hang Lee's contributions to cognitive function identification highlight his innovative spirit and dedication to technology. His patent serves as a testament to his expertise and the potential impact of his work in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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