Yongin, South Korea

Jee Ae Shim

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Sdi., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jee Ae Shim. Retrieved from https://idiyas.com/inventor/jee-ae-shim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jee Ae Shim and Secondary Battery Life Evaluation

Introduction

Jee Ae Shim is an inventor based in Yongin, South Korea. His work includes a patented apparatus and method for evaluating the life of secondary batteries.

Latest Patents

Shim’s listed patent is “Secondary Battery Life Evaluation Apparatus and Method.” The invention evaluates battery life by charging and discharging a secondary battery within its normal deterioration range. As the battery’s state of charge changes, the method reduces the accelerated charging or discharging current accordingly. These steps are repeated until the battery reaches a reference state of health, supporting a more reliable assessment of accelerated battery life. Shim is credited with 1 patent.

Career Highlights

Shim is associated with Samsung SDI Co., Ltd. His patent focuses on a battery-testing approach that aims to assess accelerated aging under conditions aligned with the battery’s normal deterioration range.

Collaborations

Hee Soo Yun and Sun Ho Ryu are identified as Shim’s coworkers. The available information does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Jee Ae Shim’s listed invention addresses the reliability of secondary battery life evaluation through controlled charging and discharging procedures.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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