Singapore, Singapore

Jeck Siu Mei Ng

This inventor holds 1 USPTO granted patent. Top assignee: Bilcare Technologies Singapore Pte. Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeck Siu Mei Ng. Retrieved from https://idiyas.com/inventor/jeck-siu-mei-ng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 5.0

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Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Jeck Siu Mei Ng: Innovator in Identification Technology

Introduction

Jeck Siu Mei Ng is a notable inventor based in Singapore, recognized for his contributions to identification technology. He has developed innovative methods that enhance the reading and verification of tags during manufacturing processes. His work is pivotal in ensuring accuracy and reliability in identification systems.

Latest Patents

Jeck Siu Mei Ng holds a patent for an "Apparatus for forming and reading an identification feature and method thereof." This invention provides a method of reading and verifying a tag based on inherent disorder during a manufacturing process. The method involves using a first reader to take an initial reading of an inherent disorder feature of the tag, followed by a second reading with a different reader. The readings are then matched to determine acceptance criteria, ensuring that the tag meets specific standards before being accepted and recorded.

Career Highlights

Jeck is currently employed at Bilcare Technologies Singapore Pte. Ltd., where he applies his expertise in developing advanced identification technologies. His innovative approach has led to significant advancements in the field, making him a valuable asset to his company.

Collaborations

Jeck collaborates with talented professionals such as Winston Cheng Lock Tan and Peter Malcolm Moran, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Jeck Siu Mei Ng's work in identification technology exemplifies the impact of innovative thinking in manufacturing processes. His patent and contributions continue to shape the future of tag verification systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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