Sherbrooke, Canada

Jean-Sébastien Labrie

This inventor holds 2 USPTO granted patents. Top assignee: Amf Automation Technologies, LLC. Active years: 2015-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean-Sébastien Labrie. Retrieved from https://idiyas.com/inventor/jean-sebastien-labrie

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2015-2017

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2 patents (USPTO):Explore Patents

Title: Biography of Jean-Sébastien Labrie

Introduction: Jean-Sébastien Labrie is an innovative inventor based in Sherbrooke, Canada. He has made significant contributions to the field of automation technology, particularly with his unique inventions.

Latest Patents: Jean-Sébastien holds a patent for an "Oven chain measurement system." This invention features a chain tensioning sprocket that is moveable with a predetermined force into a U-shaped path of a chain. It applies continuous tensioning force to the chain, allowing for the measurement of chain length changes. The movement of the chain tensioning sprocket indicates wear on the chain parts and the expected operative life of the chain.

Career Highlights: Jean-Sébastien is currently employed at Amf Automation Technologies, LLC, where he continues to develop innovative solutions in automation. His work has garnered attention for its practical applications in enhancing operational efficiency.

Collaborations: Throughout his career, Jean-Sébastien has collaborated with notable professionals in the field, including Philip J Domenicucci and Alain Lemieux. These partnerships have contributed to the advancement of his projects and innovations.

Conclusion: Jean-Sébastien Labrie's contributions to automation technology exemplify the spirit of innovation. His patent for the oven chain measurement system showcases his ability to address practical challenges in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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