Nantes, France

Jean-Pierre Bardon

This inventor holds 1 USPTO granted patent. Top assignee: The University of Nantes. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean-Pierre Bardon. Retrieved from https://idiyas.com/inventor/jean-pierre-bardon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 19(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Innovations of Jean-Pierre Bardon

Introduction

Jean-Pierre Bardon is a notable inventor based in Nantes, France. He has made significant contributions to the field of temperature measurement through his innovative work. His expertise and dedication to research have led to the development of a unique patent that addresses important challenges in surface temperature measurement.

Latest Patents

Jean-Pierre Bardon holds a patent for a "Process and device for transient measuring of surface temperatures." This invention showcases his ability to create practical solutions that enhance the accuracy and efficiency of temperature measurements in various applications.

Career Highlights

Bardon is affiliated with the Université de Nantes, where he has been involved in research and development activities. His work at the university has allowed him to collaborate with other experts in the field and contribute to advancements in technology.

Collaborations

One of his notable collaborators is Yvon Jarny. Together, they have worked on projects that leverage their combined expertise to push the boundaries of innovation in temperature measurement.

Conclusion

Jean-Pierre Bardon's contributions to the field of temperature measurement through his patent and work at the Université de Nantes highlight his role as an influential inventor. His dedication to innovation continues to inspire advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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