This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Commissariat a L'energie Atomique Et Aux Energies Alternatives. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: The Innovations of Jean-Philippe Fauvarque
Introduction
Jean-Philippe Fauvarque is a notable inventor based in L'Etang-la-Ville, France. He has made significant contributions to the field of gas permeation measurement through his innovative designs. His work is characterized by a focus on precision and efficiency in scientific instrumentation.
Latest Patents
Fauvarque holds a patent for a "Sample holder and associated permeation device." This invention is designed as a cell for measuring the permeation of a target gas through a sample. The device includes upstream and downstream chambers connected by an opening, a primary seal in contact with the bottom of the upstream chamber, and a removable sample holder. The sample holder is equipped with means for assembling the sample and features seals that ensure accurate measurements. This patent showcases his expertise in developing advanced scientific tools.
Career Highlights
Jean-Philippe Fauvarque is associated with the Commissariat à l'énergie atomique et aux énergies alternatives, a prominent research institution in France. His role in this organization has allowed him to work on cutting-edge projects that push the boundaries of scientific research. His dedication to innovation has earned him recognition in his field.
Collaborations
Fauvarque has collaborated with esteemed colleagues such as Stéphane Cros and Arnaud Leroy. These partnerships have fostered a creative environment that encourages the exchange of ideas and advancements in technology.
Conclusion
Jean-Philippe Fauvarque's contributions to the field of gas permeation measurement highlight his innovative spirit and commitment to scientific advancement. His patent reflects a significant step forward in the development of precise measurement devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
