Talence, France

Jean-Paul Darnault

This inventor holds 1 USPTO granted patent. Top assignee: I2s, LLC. Active years: 1988.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Jean-Paul Darnault

Introduction

Jean-Paul Darnault is a notable inventor based in Talence, France. He has made significant contributions to the field of automatic inspection technology. His innovative approach has led to the development of a unique patent that enhances the quality control processes in various industries.

Latest Patents

Darnault holds a patent for a "Process and apparatus for the automatic inspection by transparency." This invention focuses on a method for inspecting the transparency contrast of containers. The process involves illuminating the container transversely and utilizing two charge transfer cameras to analyze the transparency. By eliminating signals from areas outside a designated electronic window, the system can effectively assess the quality of the container. If the inspection reveals a number of defects beyond a predetermined threshold, the container is automatically rejected. This technology is particularly applicable to the inspection of bottles.

Career Highlights

Jean-Paul Darnault has been associated with I2S, LLC, where he has furthered his research and development efforts. His work has been instrumental in advancing automatic inspection technologies, making significant impacts in quality assurance processes.

Collaborations

Darnault has collaborated with notable colleagues such as Alain Ricros and Jean-Louis Blouin. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Jean-Paul Darnault's innovative contributions to automatic inspection technology exemplify the impact of dedicated inventors in enhancing industrial processes. His patent reflects a commitment to quality and efficiency in manufacturing.

Profile summary based on public USPTO records.
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