Saint-Donan, France

Jean-Michel Turmel

This inventor holds 1 USPTO granted patent. Top assignee: Cernix. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean-Michel Turmel. Retrieved from https://idiyas.com/inventor/jean-michel-turmel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jean-Michel Turmel

Introduction

Jean-Michel Turmel is an accomplished inventor based in Saint-Donan, France. He has made significant contributions to the field of waste processing, particularly in methods that address metal contaminants. His innovative approach has garnered attention in the industry.

Latest Patents

Jean-Michel holds a patent for a "Method for processing waste containing metal contaminants." This patent showcases his commitment to developing sustainable solutions for environmental challenges. His work in this area is crucial for improving waste management practices.

Career Highlights

Throughout his career, Jean-Michel has been associated with Cernix, a company focused on innovative waste processing technologies. His role at Cernix has allowed him to apply his expertise in practical settings, contributing to advancements in the industry.

Collaborations

Jean-Michel has collaborated with notable colleagues, including Paul Grange and Yves Laurent. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of new technologies.

Conclusion

Jean-Michel Turmel's contributions to waste processing and his innovative patent reflect his dedication to environmental sustainability. His work continues to inspire advancements in the field, making a positive impact on waste management practices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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