Saint Martin Le Vinoux, France

Jean-Luc Jaffrezo

This inventor holds 1 USPTO granted patent. Top assignees: Centre National De La Recherche Scientifique, Institut De Recherche Pour Le Developpement, Institut Polytechnique De Grenoble. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean-Luc Jaffrezo. Retrieved from https://idiyas.com/inventor/jean-luc-jaffrezo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jean-Luc Jaffrezo: Inventor of an On-Line Air-Quality Measurement Method.

Introduction

Jean-Luc Jaffrezo is an inventor based in Saint-Martin-le-Vinoux, France. His patent work concerns measuring the oxidation potential of samples, particularly aerosols, to support real-time analysis of air quality and potential toxicity.

Latest Patents

Jaffrezo is associated with 1 patent: “Method for Measuring the Oxidation Potential of Samples, in Particular Aerosols, Equipment for the Implementation Thereof and Use of Same for On-Line Analysis of Air Quality.” The invention describes an automatic method for determining the oxidation potential of an environment on-line and in real time. It is intended to help analyze air quality and assess the toxicity of vapors emitted by appliances or facilities.

Career Highlights

Jaffrezo has worked with the Centre National de la Recherche Scientifique and Grenoble Institute of Technology (Institut Polytechnique de Grenoble). His patent reflects an application of measurement technology to environmental monitoring.

Collaborations

His listed coworkers include Gaëlle Uzu and Guilhem Freche, whose work is associated with his professional and research network.

Conclusion

Jean-Luc Jaffrezo’s patent focuses on practical, real-time assessment of oxidation potential, contributing a measurement approach for air-quality analysis and the evaluation of potentially harmful emissions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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