Plaisir, France

Jean-Luc Baudry

This inventor holds 1 USPTO granted patent. Top assignee: G.e. Medical Systems, S.a.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean-Luc Baudry. Retrieved from https://idiyas.com/inventor/jean-luc-baudry

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Innovations of Jean-Luc Baudry in Radiography

Introduction

Jean-Luc Baudry is a notable inventor based in Plaisir, France. He has made significant contributions to the field of radiography, particularly through his innovative patent that enhances the efficiency of radiographic imaging.

Latest Patents

Jean-Luc Baudry holds a patent for a "Method and apparatus for radiography having an antiscatter grid." This invention involves a unique movement of an anti-scatter grid in a radiography apparatus. The movement is characterized by a continuous curve that exhibits point symmetry with respect to the midpoint of the exposure time. The design ensures that the grid is moved at a high rate near both the starting and ending positions, optimizing the imaging process.

Career Highlights

Baudry is associated with G.E. Medical Systems, S.A., where he applies his expertise in radiography. His work has contributed to advancements in medical imaging technology, improving diagnostic capabilities.

Collaborations

He has collaborated with notable colleagues such as Andreas Rick and Serge Muller, further enhancing the innovative efforts within his field.

Conclusion

Jean-Luc Baudry's contributions to radiography through his patented inventions demonstrate his commitment to advancing medical technology. His work continues to influence the field and improve patient outcomes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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