This inventor holds 2 USPTO granted patents. Top assignee: Sollac (Societe Anonyme). Active years: 1995-1996.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1995-1996
Title: Innovations of Jean-Jacques Campas
Introduction
Jean-Jacques Campas is a notable inventor based in Colligny, France. He has made significant contributions to the field of measurement technology, particularly in the calibration and measurement of metal products. With a total of 2 patents, his work has advanced the capabilities of industrial measurement devices.
Latest Patents
One of his latest patents is a "Device for the measurement of the thickness profile of a metal product." This invention relates to a device designed to measure the thickness profile of a moving strip or plate of metal. It utilizes an X-ray source and a detection unit to accurately assess the thickness profile. The device includes advanced features such as cooling mechanisms for the detection unit and a support plate that integrates necessary electrical and fluid connections.
Another significant patent is the "Method and device for calibrating an apparatus for measuring the thickness profile of flat products." This device is designed to calibrate measurement apparatuses that utilize radiation sources, such as X-ray sources, and includes a set of shims with varying radiation absorption characteristics. The calibration process involves moving the shims through a passage zone to intercept radiation, allowing for precise readings and the establishment of calibration curves for each sensor.
Career Highlights
Jean-Jacques Campas has worked with Sollac, a prominent company in the metal industry. His role at Sollac has allowed him to apply his innovative ideas and contribute to the development of advanced measurement technologies.
Collaborations
Throughout his career, Campas has collaborated with notable colleagues, including Stephane Terreaux and Patrick Vanhee. These collaborations have fostered an environment of innovation and have led to the successful development of his patented technologies.
Conclusion
Jean-Jacques Campas is a distinguished inventor whose work in measurement technology has made a significant impact in the industry. His patents reflect his commitment to innovation and precision in the field of metal product measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile