Richland, WA, United States of America

Jean H Futrell

This inventor holds 1 USPTO granted patent. Top assignee: Battelle Memorial Institute. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean H Futrell. Retrieved from https://idiyas.com/inventor/jean-h-futrell

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Biography of Inventor Jean H Futrell

Introduction: Jean H Futrell is an accomplished inventor based in Richland, WA (US). He has made significant contributions to the field of molecular sequencing through his innovative work.

Latest Patents: Jean H Futrell holds a patent for a "Method and apparatus for enhanced sequencing of complex molecules using surface-induced dissociation in conjunction with mass spectrometric analysis." This invention relates to a method and apparatus that enhances the sequencing of complex molecules by utilizing surface-induced dissociation (SID) alongside mass spectrometric analysis. The results demonstrate the formation of a wide distribution of structure-specific fragments, providing extensive sequence coverage that is useful for sequencing and identifying complex molecules.

Career Highlights: Jean is associated with the Battelle Memorial Institute, where he has been able to apply his expertise in molecular analysis and contribute to advancements in the field.

Collaborations: Throughout his career, Jean has collaborated with notable professionals, including Julia Laskin, who is also recognized for her contributions in the field.

Conclusion: Jean H Futrell's innovative work and dedication to enhancing molecular sequencing have established him as a prominent figure in his field. His contributions continue to impact the scientific community positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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