Metz, France

Jean F Muller

This inventor holds 1 USPTO granted patent. Top assignee: Universite De Metz. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean F Muller. Retrieved from https://idiyas.com/inventor/jean-f-muller

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1989

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Jean F. Muller

Introduction

Jean F. Muller is a notable inventor based in Metz, France. He has made significant contributions to the field of engineering, particularly with his innovative designs and patents. His work focuses on the translatory manipulation of elements, showcasing his expertise and creativity in the field.

Latest Patents

Jean F. Muller holds a patent for an "Apparatus for the translatory manipulation of an element such as an axle." This invention demonstrates his ability to address complex engineering challenges and provide practical solutions. He has 1 patent to his name, reflecting his commitment to innovation.

Career Highlights

Muller is affiliated with the Université de Metz, where he continues to contribute to research and development in engineering. His role at the university allows him to engage with students and fellow researchers, fostering an environment of learning and innovation.

Collaborations

Throughout his career, Jean F. Muller has collaborated with talented individuals such as Gabriel Krier and Serge Dominiak. These partnerships have enriched his work and expanded the impact of his inventions.

Conclusion

Jean F. Muller exemplifies the spirit of innovation through his patent and contributions to engineering. His work at the Université de Metz and collaborations with other professionals highlight his dedication to advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…