Nancy, France

Jean-Claude Lepecq

This inventor holds 1 USPTO granted patent. Top assignee: Centre National De La Recherche Scientifique. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean-Claude Lepecq. Retrieved from https://idiyas.com/inventor/jean-claude-lepecq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jean-Claude Lepecq

Introduction

Jean-Claude Lepecq is a notable inventor based in Nancy, France. He has made significant contributions to the field of examination devices, particularly in determining various conditions of subjects. His work is recognized for its innovative approach and practical applications.

Latest Patents

Jean-Claude Lepecq holds a patent for a "Device for examining a subject and, in particular, determining his or her condition." This invention showcases his commitment to advancing medical technology and improving diagnostic methods. He has 1 patent to his name, reflecting his innovative spirit and dedication to research.

Career Highlights

Lepecq is affiliated with the Centre National de la Recherche Scientifique, a prestigious research institution in France. His role there has allowed him to engage in cutting-edge research and collaborate with other experts in the field. His contributions have been instrumental in enhancing the capabilities of examination devices.

Collaborations

Throughout his career, Jean-Claude has worked alongside esteemed colleagues such as Pierre-Marie Baudonniere and Francedillaois Jouen. These collaborations have enriched his research and led to advancements in their shared field of study.

Conclusion

Jean-Claude Lepecq's work exemplifies the spirit of innovation in medical technology. His patent and collaborations highlight his commitment to improving examination devices, making a lasting impact in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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