This inventor holds 2 USPTO granted patents. Top assignee: Other. Active years: 2002.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002
Title: Innovations by Jean-Claude Krapez
Introduction
Jean-Claude Krapez is a notable inventor based in Châtillon, France. He has made significant contributions to the field of thermal imaging, particularly in the inspection of materials. With a total of 2 patents, his work focuses on enhancing the efficiency and accuracy of thermographic inspections.
Latest Patents
Krapez's latest patents include a "Method and device for the inspection of a material by thermal imaging." This invention involves a heating zone and a detection zone that are strategically displaced to scan the surface of a part. The method allows for the detection of radiated flux using a line of detectors selected from a matrix. This innovation significantly reduces the time required for surface scanning and enables easy adjustment of the offset between the heating and detection zones. His second patent, "Method for the inspection of a part by thermal imaging," describes a process where heat is imparted to a heating zone on the surface of a part. The scanning is performed by synchronously moving the detection zone with the heating zone, allowing for detailed analysis of the part's surface.
Career Highlights
Throughout his career, Krapez has focused on developing methods that improve the inspection processes for various materials, especially metals with complex shapes. His inventions are particularly valuable in industries where precision and reliability are paramount.
Collaborations
Krapez has worked alongside notable colleagues such as Laurent Legrandjacques and Christophe F Dehan. Their collaborative efforts have contributed to the advancement of thermal imaging technologies.
Conclusion
Jean-Claude Krapez's innovative work in thermal imaging inspection has paved the way for more efficient and accurate methods in material analysis. His contributions are essential for industries that rely on precise inspections of complex parts.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile