Vincennes, France

Jean-Baptiste Orfila

This inventor holds 1 USPTO granted patent and 1 published patent application and 2 EPO patents. Top assignee: Zama Sas. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean-Baptiste Orfila. Retrieved from https://idiyas.com/inventor/jean-baptiste-orfila

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jean-Baptiste Orfila: Inventor in Homomorphic Encryption

Introduction

Jean-Baptiste Orfila is an inventor based in Vincennes, France. His patent work concerns computation on encrypted data, a field that aims to enable calculations while keeping the underlying information protected.

Latest Patents

Orfila is associated with 1 patent, titled “Computation on LWE-Encrypted Values.” The invention describes a computer-implemented method for computing a product from values encrypted using the Learning With Errors (LWE) scheme.

In the TFHE setting, the method uses cryptographic key switching to convert LWE-encrypted inputs into GLWE-encrypted polynomials. It then performs encrypted polynomial multiplication and applies sample extraction to obtain an LWE-encrypted product. The approach supports computation on encrypted values without first exposing the underlying data.

Career Highlights

Orfila works at Zama SAS, a company focused on fully homomorphic encryption. His listed patent reflects work on cryptographic techniques for processing encrypted data.

Collaborations

Orfila’s listed coworkers include Samuel Tap and Ilaria Chillotti. Their shared professional context is Zama SAS and its work in homomorphic encryption.

Conclusion

Jean-Baptiste Orfila’s patent on computation with LWE-encrypted values highlights an approach to performing useful calculations while preserving data confidentiality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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