Plainsboro, NJ, United States of America

Jean A Dussault

This inventor holds 1 USPTO granted patent. Top assignee: Western Electric Company, Inc.. Active years: 1984.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jean A Dussault. Retrieved from https://idiyas.com/inventor/jean-a-dussault

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1984

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1 patent (USPTO):Explore Patents

Title: Innovations by Jean A Dussault

Introduction

Jean A Dussault is a notable inventor based in Plainsboro, NJ (US). She has made significant contributions to the field of circuit testing, showcasing her expertise through her innovative patent.

Latest Patents

Dussault holds a patent for an "Apparatus for testing digital and analog circuits." This invention describes a high-speed, high-resolution testing circuit designed for both analog and digital circuit packs. The testing circuit employs data compression techniques and comprises a shift register with an overall length that is selectively variable under program control. Additionally, it features an arrangement for combining incoming data signals with feedback signals from predetermined stages of the shift register. The positions of the feedback taps of the variable length shift register are also selectively variable under program control.

Career Highlights

Jean A Dussault is associated with Western Electric Company, Inc., where she has applied her skills and knowledge in the development of advanced testing technologies. Her work has contributed to enhancing the efficiency and accuracy of circuit testing processes.

Conclusion

Jean A Dussault's innovative approach to circuit testing exemplifies her commitment to advancing technology in the field. Her patent reflects her expertise and dedication to improving electronic testing methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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