Company Filing History:
Years Active: 1996
Title: Jay F Marchiando: Innovator in Semiconductor Measurement Technology
Introduction
Jay F Marchiando is a notable inventor based in Germantown, MD (US). He has made significant contributions to the field of semiconductor technology, particularly in the measurement of linewidths of conductors. His innovative approach has led to the development of a unique method that enhances the accuracy of measurements in semiconductor substrates.
Latest Patents
Marchiando holds a patent for a method titled "Non-contact measurement of linewidths of conductors in semiconductor." This patent describes a process that involves preparing mutually separated test and interconnection areas on a semiconductor substrate. The method includes forming an electrical interconnection conductor with a uniform linewidth and creating a test structure with closed loops of the electrical conductor. The innovation allows for measuring the impedance or complex reflection coefficient of the test structure without direct contact, thereby determining the linewidth of the interconnection conductor.
Career Highlights
Jay F Marchiando is associated with the Government of the United States of America, as represented by the Secretary of Commerce. His work has been instrumental in advancing measurement techniques in semiconductor technology. He has demonstrated a commitment to innovation and excellence in his field.
Collaborations
Marchiando has collaborated with Robert D Larrabee, contributing to the development of advanced measurement techniques in semiconductor applications.
Conclusion
Jay F Marchiando's contributions to semiconductor measurement technology exemplify the spirit of innovation. His patented method for non-contact measurement of linewidths represents a significant advancement in the field.