This inventor holds 1 USPTO granted patent. Top assignee: Iowa State University Research Foundation Inc.. Active years: 2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000
Title: Jay A. Bieber and Pulsed Eddy Current Inspection
Introduction
Jay A. Bieber is an inventor associated with Ames, Iowa, and Iowa State University Research Foundation Inc. His patent work addresses pulsed eddy current inspection, a technique for evaluating structures and identifying flaws.
Latest Patents
The provided information identifies one patent associated with Bieber: “Pulsed Eddy Current Inspections and the Calibration and Display of” (the title appears incomplete in the supplied data). The invention processes pulsed eddy current responses collected at different locations and compares them with a reference response. It stores the resulting time and magnitude values alongside location information, then uses filtered measurements to create an image of the inspected structure.
The filtering can exclude signals associated with fasteners, air gaps between structural layers, or excessive probe lift-off. It can also isolate information from a selected layer or depth. Calibration curves can be used to quantify flaws, while Fourier transforms can produce frequency-based measurements for display. The patent record lists 1 patent.
Career Highlights
Bieber’s listed patent reflects work on inspection methods that combine signal processing, calibration, and visual presentation. By filtering measurements according to time or frequency conditions, the approach is designed to help distinguish relevant structural information from signals caused by inspection conditions or features of the material.
Collaborations
The supplied information names John C. Moulder and Sunil K. Shaligram as Bieber’s coworkers. Iowa State University Research Foundation Inc. is identified as the associated company.
Conclusion
Jay A. Bieber’s listed invention focuses on making pulsed eddy current inspection results more interpretable through signal filtering, calibration, and image display.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile