Vancouver, Canada

Javier Ignacio Gazzarri

This inventor holds 1 USPTO granted patent. Top assignee: Forintek Canada Corporation. Active years: 2006.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Innovations of Javier Ignacio Gazzarri

Introduction

Javier Ignacio Gazzarri is a notable inventor based in Vancouver, Canada. He has made significant contributions to the field of surface profile measurement through his innovative patent. His work focuses on developing methods that enhance the accuracy and efficiency of measuring surface profiles, even in challenging conditions.

Latest Patents

Gazzarri holds a patent titled "Surface profile measurement, independent of relative motions." This invention presents a general method for using distance sensors to measure the surface profile and twist of objects. The method is particularly effective in scenarios where there are rigid-body motions between the surface and the sensors. By making multiple sequential measurements from a group of sensors while the object moves, Gazzarri's invention can accurately determine the surface height profile. The mathematical procedures employed in this method allow for the separation of delayed and simultaneous components of the measurements, making it versatile for various measurement types.

Career Highlights

Gazzarri is associated with Forintek Canada Corporation, where he applies his expertise in surface measurement technologies. His work has contributed to advancements in the field, showcasing his commitment to innovation and research.

Collaborations

Gazzarri has collaborated with Gary Stephen Schajer, further enhancing the impact of his work in the industry.

Conclusion

Javier Ignacio Gazzarri's contributions to surface profile measurement demonstrate his innovative spirit and dedication to advancing technology. His patent reflects a significant step forward in the field, showcasing the potential for improved measurement techniques.

Profile summary based on public USPTO records.
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