This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Imec Vzw, Katholieke Universiteit Leuven, K.u.leuven R&D. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 1,865 
1 out of 2 Years Active: 2026
Title: Javier Diaz Fortuny and Tamper-Aware Age Sensing
Introduction
Javier Diaz Fortuny is an inventor based in Heverlee, Belgium. His patent work includes a sensor designed to estimate the operating age of an integrated circuit by monitoring performance degradation.
Latest Patents
The provided information lists one patent associated with Fortuny: “Tamper-aware age sensor.” The invention describes a sensor that can operate in regular-use or readout mode. It combines a performance monitor responsive to temperature and voltage stress with a pre-stressed anneal monitor responsive to temperature stress. In regular-use mode, the performance monitor receives the integrated circuit’s operating voltage. In readout mode, both monitor types generate output signals indicating performance degradation. The patent also describes a related tamper-detection method.
Career Highlights
Fortuny’s listed professional affiliations include Katholieke Universiteit Leuven, K.U. Leuven R&D, and imec vzw. His work on age sensing addresses the challenge of assessing integrated-circuit degradation and detecting potential tampering.
Collaborations
His listed coworkers include Robin Degraeve and Benjamin Kaczer.
Conclusion
Javier Diaz Fortuny’s patent on tamper-aware age sensing brings together stress monitoring and degradation assessment to help evaluate the operating age and integrity of integrated circuits.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile