Richland, WA, United States of America

Jason S Thompson

This inventor holds 1 USPTO granted patent. Top assignee: Battelle Memorial Institute. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jason S Thompson. Retrieved from https://idiyas.com/inventor/jason-s-thompson-9iknjfvk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 13.0

ph-index = 1

Forward Citations = 39(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Innovations of Jason S. Thompson

Introduction

Jason S. Thompson is an accomplished inventor based in Richland, WA (US). He has made significant contributions to the field of acoustic signature inspection. His innovative work focuses on non-invasive methods for inspecting containers, which has important applications in various industries.

Latest Patents

Jason holds a patent for "Methods and apparatus for multi-parameter acoustic signature inspection." This invention describes a multiparameter acoustic signature inspection device and method that allows for the non-invasive inspection of containers. The device utilizes dual acoustic signatures to discriminate between various fluids and materials, enabling accurate identification.

Career Highlights

Jason is currently employed at Battelle Memorial Institute, where he continues to develop and refine his innovative ideas. His work at Battelle has positioned him as a key player in the field of acoustic inspection technologies.

Collaborations

Jason has collaborated with notable colleagues, including Juan D. Valencia and Kevin L. Gervais. These partnerships have fostered a creative environment that enhances the development of cutting-edge technologies.

Conclusion

Jason S. Thompson's contributions to acoustic signature inspection demonstrate his commitment to innovation and excellence in his field. His patent and work at Battelle Memorial Institute highlight the importance of non-invasive inspection methods in modern technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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