Neenah, WI, United States of America

Jason R Anderson

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Memorylink Corporation. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jason R Anderson. Retrieved from https://idiyas.com/inventor/jason-r-anderson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Innovations of Jason R Anderson

Introduction

Jason R Anderson is an accomplished inventor based in Neenah, WI (US). He has made significant contributions to the field of data processing through his innovative patent. His work focuses on improving the efficiency and accuracy of data slicing methods.

Latest Patents

Jason R Anderson holds a patent for a "Baseband data slicing method and apparatus." This invention features a DC-coupled data slicer that operates on a baseband signal using a variable threshold, while an AC-coupled data slicer operates based on a fixed threshold. The variable threshold is initially set to a stored value from previous uses. The invention addresses the challenges posed by settling times in prior art techniques, allowing for adjustments to the variable threshold after a predetermined delay.

Career Highlights

Throughout his career, Jason has worked with notable companies, including Memorylink Corporation and Memlnk Digital Ltd., L.L.C. His experience in these organizations has contributed to his expertise in data processing technologies.

Collaborations

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Conclusion

Jason R Anderson's innovative work in data slicing methods showcases his dedication to advancing technology in the field. His contributions continue to influence the industry and pave the way for future developments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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