Oviedo, FL, United States of America

Jason Paul Wojack


Average Co-Inventor Count = 4.6

ph-index = 1

Forward Citations = 60(Granted Patents)


Company Filing History:


Years Active: 2021-2025

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3 patents (USPTO):Explore Patents

Title: Jason Paul Wojack: Innovator in Lidar Technology

Introduction

Jason Paul Wojack is a notable inventor based in Oviedo, FL (US), recognized for his contributions to lidar technology. With a total of 3 patents, Wojack has made significant advancements in the field, particularly in high-resolution scanning systems.

Latest Patents

Wojack's latest patents include innovative lidar systems designed to enhance scanning capabilities. One of his patents, titled "Lidar system with locally retraced scan lines," describes a lidar system that utilizes a light source to emit pulses of light. The system features a scanner that scans these pulses along a high-resolution scan pattern, employing one or more scan mirrors to produce multiple scan lines. Each scan line is associated with multiple pixels, allowing for detailed imaging within the lidar system's field of regard. Another patent, "Lidar system with high-resolution scan pattern," similarly focuses on a scanner that distributes scan lines along a second scan axis, incorporating interlaced scan lines and pixels to improve resolution.

Career Highlights

Throughout his career, Wojack has worked with prominent companies in the technology sector, including Luminar Technologies, Inc. and Luminar, LLC. His experience in these organizations has contributed to his expertise in lidar systems and their applications.

Collaborations

Wojack has collaborated with talented individuals in the field, including Istvan Peter Burbank and Matthew D Weed. These partnerships have likely fostered innovation and the development of cutting-edge technologies.

Conclusion

Jason Paul Wojack stands out as an influential inventor in the realm of lidar technology, with a focus on enhancing scanning systems. His patents reflect a commitment to innovation and advancement in this critical area of technology.

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