Crown Point, IN, United States of America

Jason P Grochowski

This inventor holds 3 USPTO granted patents and 2 published patent applications. Top assignee: Tanita Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jason P Grochowski. Retrieved from https://idiyas.com/inventor/jason-p-grochowski

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 3

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2006

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3 patents (USPTO):Explore Patents

Title: Jason P. Grochowski: Innovator in Scales

Introduction

Jason P. Grochowski is a notable inventor based in Crown Point, IN (US). He has made significant contributions to the field of scales, holding a total of 3 patents. His work is recognized for its innovation and practicality, particularly in the realm of measurement technology.

Latest Patents

Among his latest patents, Jason has developed advanced scale technologies that enhance accuracy and user experience. These innovations reflect his commitment to improving measurement devices for various applications.

Career Highlights

Jason is currently employed at Tanita Corporation, a company renowned for its precision measurement instruments. His role at Tanita has allowed him to further his research and development efforts in the field of scales, contributing to the company's reputation for quality and innovation.

Collaborations

Throughout his career, Jason has collaborated with talented individuals such as Charles Young Choi and James G. Montagnino. These partnerships have fostered a creative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

In summary, Jason P. Grochowski is a dedicated inventor whose work in scale technology has made a significant impact. His contributions continue to shape the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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