Montclair, NJ, United States of America

Jason Lee

This inventor holds 3 USPTO granted patents. Top assignee: Bnox, Inc.. Active years: 1995-1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jason Lee. Retrieved from https://idiyas.com/inventor/jason-lee-1d3exd31

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1995-1997

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3 patents (USPTO):Explore Patents

Title: Jason Lee - Innovator in Binocular Technology

Introduction

Jason Lee is a notable inventor based in Montclair, NJ (US). He has made significant contributions to the field of optics, particularly with his innovative designs in binocular technology. With a total of 3 patents to his name, Lee continues to push the boundaries of what is possible in this area.

Latest Patents

Among his latest inventions, Jason Lee has developed advanced binoculars that enhance the user experience through improved functionality and design. These binoculars reflect his commitment to innovation and quality in optical devices.

Career Highlights

Jason Lee is currently employed at Bnox, Inc., where he applies his expertise in optics to develop cutting-edge products. His work at Bnox, Inc. has positioned him as a key player in the industry, contributing to the company's reputation for excellence.

Collaborations

Jason collaborates with talented individuals in his field, including his coworker Arthur P. Becker. Together, they work on projects that aim to revolutionize the way consumers interact with optical devices.

Conclusion

In summary, Jason Lee is a dedicated inventor whose work in binocular technology has garnered attention and respect in the industry. His innovative spirit and collaborative efforts continue to drive advancements in optical devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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