Abington, PA, United States of America

Jason LaForest

This inventor holds 1 USPTO granted patent. Top assignee: Microtrac Inc.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jason LaForest. Retrieved from https://idiyas.com/inventor/jason-laforest

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2018

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations by Jason LaForest

Introduction

Jason LaForest is an accomplished inventor based in Abington, PA. He has made significant contributions to the field of particle measurement technology. His innovative approach combines light scattering and optical imaging to enhance measurement accuracy.

Latest Patents

LaForest holds a patent for a "Method and apparatus for measurement of particle characteristics using light scattering and optical imaging." This invention utilizes two light sources to measure light scattering from particles and capture images of particles within the same sample cell. This dual approach allows for more comprehensive analysis and understanding of particle characteristics.

Career Highlights

LaForest is currently employed at Microtrac Inc., where he continues to develop and refine technologies related to particle measurement. His work at Microtrac has positioned him as a key player in advancing measurement techniques in various industries.

Collaborations

LaForest collaborates with his coworker, Michael N Trainer, to further enhance the capabilities of their technologies. Their combined expertise contributes to the innovative solutions offered by Microtrac Inc.

Conclusion

Jason LaForest's contributions to particle measurement technology exemplify the impact of innovation in scientific research. His patent and ongoing work at Microtrac Inc. highlight the importance of advancements in measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…