Pittsburgh, PA, United States of America

Jason Eger

This inventor holds 4 USPTO granted patents. Top assignee: Eresearchtechnology, Inc.. Active years: 2019-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jason Eger. Retrieved from https://idiyas.com/inventor/jason-eger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2019-2025

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4 patents (USPTO):Explore Patents

Title: Jason Eger: Innovator in Data Analysis

Introduction

Jason Eger is a notable inventor based in Pittsburgh, PA (US). He has made significant contributions to the field of data analysis, holding a total of 4 patents. His work focuses on developing systems and methods that enhance the way data is aggregated and analyzed.

Latest Patents

Among his latest patents, Jason has developed innovative methods and systems for data analysis. These patents provide systems, methods, and computer-readable mediums for entering, identifying, and aggregating data for analysis in electronic devices. The data utilized in these systems comes from a plurality of multi-participant surveys, showcasing his commitment to improving data handling and analysis.

Career Highlights

Jason Eger is currently employed at Eresearchtechnology, Inc., where he continues to push the boundaries of data analysis technology. His work at the company has been instrumental in advancing the capabilities of data processing and analysis.

Collaborations

Jason collaborates with talented individuals such as Jon McClelland and Dave Peterson. Their combined expertise contributes to the innovative environment at Eresearchtechnology, Inc.

Conclusion

In summary, Jason Eger is a dedicated inventor whose work in data analysis has led to multiple patents and significant advancements in the field. His contributions are shaping the future of how data is processed and analyzed.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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