Austin, TX, United States of America

Jason E Doege


Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 67(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):

Title: Jason E Doege: Innovator in Integrated Circuit Testing

Introduction

Jason E Doege is an inventive mind based in Austin, TX, celebrated for his contributions to the field of integrated circuit (IC) testing. With a focus on enhancing the reliability and efficiency of functional specifications, Doege has made a significant impact through his innovative methods.

Latest Patents

Doege holds one patent entitled, "Scan Based Testing of an Integrated Circuit for Compliance with Timing." This patent outlines a sophisticated method and implementation to improve the testable design of IC devices. The architecture integrates functional and testing paths, allowing for seamless transitions between providing functional output signals and testing output signals throughout the circuit. This innovation ensures rigorous compliance with timing specifications, enhancing the overall performance and reliability of integrated circuits.

Career Highlights

In his professional journey, Jason E Doege has made substantial contributions to Motorola Corporation, where he has harnessed his expertise to further innovations in IC technology. His work has positioned him as an essential figure in the advancement of testing methodologies within the semiconductor industry, demonstrating a commitment to ensuring high-quality electronic devices.

Collaborations

Throughout his career, Doege has collaborated with notable colleagues, including Grady L Giles and Alfred Larry Crouch. These partnerships have fostered a culture of innovation, enabling the team at Motorola to explore and develop cutting-edge solutions in integrated circuits.

Conclusion

Jason E Doege exemplifies the spirit of innovation within the realm of integrated circuits. His patent and collaborative efforts underscore the importance of advancing testing methodologies, contributing to the reliability of electronic components in various applications. As the technology landscape evolves, Doege's work will likely continue to inspire future breakthroughs in the field.

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