Austin, TX, United States of America

Jason Doege


Average Co-Inventor Count = 1.6

ph-index = 3

Forward Citations = 31(Granted Patents)


Company Filing History:


Years Active: 2005-2016

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4 patents (USPTO):Explore Patents

Title: Jason Doege: Innovator in Integrated Circuit Testing

Introduction

Jason Doege is a prominent inventor based in Austin, TX, known for his contributions to the field of integrated circuit testing. With a total of four patents to his name, Doege has made significant advancements in methods and apparatuses that enhance the security and efficiency of integrated circuits.

Latest Patents

Among his latest patents is a method and apparatus for securing access to an integrated circuit. This innovation describes a process for securely testing an integrated circuit (IC) by utilizing a series of bit streams that include both unencrypted and encrypted data. The method involves generating a pseudorandom pattern and convolving various bit streams to ensure secure testing of the IC. Another notable patent is the dynamically reconfigurable precision signal delay test system for automatic test equipment. This system features a programmable time event and waveform generator that applies precise timing patterns to logic circuits, capturing response data effectively.

Career Highlights

Throughout his career, Jason Doege has worked with notable companies such as Inovys Corporation and Advanced Micro Devices Corporation. His experience in these organizations has allowed him to refine his skills and contribute to significant advancements in integrated circuit technology.

Collaborations

Doege has collaborated with various professionals in the field, including his coworker Phillip D Burlison. Their joint efforts have further propelled innovations in integrated circuit testing.

Conclusion

Jason Doege's work in integrated circuit testing exemplifies the impact of innovative thinking in technology. His patents reflect a commitment to enhancing security and precision in electronic testing.

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