Company Filing History:
Years Active: 2025
Title: Jaroslav Hadzima: Innovator in Sample Handling for Charged Particle Microscopy
Introduction
Jaroslav Hadzima is a notable inventor based in Trnava, Slovakia. He has made significant contributions to the field of charged particle microscopy through his innovative patent. His work focuses on improving the handling and storage of samples used in advanced microscopy techniques.
Latest Patents
Jaroslav Hadzima holds a patent for a "System and method for handling samples for study in a charged particle apparatus, such as a transmission electron microscope." This invention relates to a sample handling and storage system designed for cryogenic samples. The system is specifically tailored for use in charged particle microscopy, including cryo-electron microscope samples for cryo-transmission electron microscopy. It features a storage apparatus for multiple samples and a transfer device that connects to both the storage apparatus and the charged particle apparatus, facilitating efficient sample transfer.
Career Highlights
Jaroslav is currently employed at FEI Company, where he continues to develop innovative solutions in microscopy. His expertise in sample handling systems has positioned him as a valuable asset in the field of charged particle microscopy.
Collaborations
Throughout his career, Jaroslav has collaborated with talented individuals such as Jiří Benda and Vojtěch Doležal. These collaborations have further enhanced his work and contributed to advancements in microscopy technology.
Conclusion
Jaroslav Hadzima's contributions to the field of charged particle microscopy through his innovative patent demonstrate his commitment to advancing scientific research. His work in sample handling systems is crucial for the future of microscopy techniques.